黄萌

黄萌.jpg

  黄萌,博士,副教授

  Email: meng.huang@whu.edu.cn

  地址:武汉大学电气工程学院三教3413室

  个人简介:

  2006年和2008年分别获华中科技大学工学学士、硕士学位。2013年获香港理工大学博士学位。2013年2月-8月任香港理工大学助理研究员。2013年8月就职于武汉大学电气工程学院。主要研究方向为电力电子变换器非线性行为及应用,电力电子装置可靠性分析。主持国家自然科学基金青年基金1项(51507118),新能源与储能运行控制国家重点实验室开放基金1项(NY851201700684),发表SCI/EI检索论文30余篇(其中SCI检索13篇),获IEEE Transactions on Power Electronics最佳论文奖1次。

  讲授课程(面向电气工程学院本科生)

  模拟电子技术;数字电子技术

  主要论文:

  [1] M. Huang, H. Ji, L. Wei, J. Sun and X. Zha, “Bifurcation based stability analysis of photovoltaic-battery hybrid power system,” IEEE Journal of Emerging and Selected Topics in Power Electronics, vol. 5, no. 3, pp. 1055-1067, Nov. 2017.

  [2] M. Huang, Y. Peng, C. K. Tse, Y. Liu and X. Zha, “Bifurcation and large signal stability analysis of three-phase voltage-source converters under grid voltage dips,” IEEE Transactions on Power Electronics, vol. 32, no. 11, pp. 8868-8879, Nov. 2017.

  [3] Y. Liu, M. Huang*, H. Wang, X. Zha, J. Gong and J. Sun, “Reliability-oriented optimization of the LC filter in a buck dc-dc converter,” IEEE Transactions on Power Electronics, vol. 32, no. 8, pp. 6323-6337, Aug. 2017.

  [4] C. Wan, M. Huang, C. K. Tse, and X. Ruan, “Effects of interaction of power converters coupled via power grid: a design-oriented study,” IEEE Transactions on Power Electronics, vol. 30, no. 7, pp. 3589–3600, Jul. 2015.

  [5] M. Huang, C. K. Tse, S. C. Wong, C. Wan and X. Ruan, “Low-frequency Hopf bifurcation and its effects on stability margin in three-phase PFC power supplies connected to non-ideal power grid,” IEEE Transactions on Circuits and Systems I – Regular Papers, vol. 60, no. 12, pp. 3328-3340, Dec. 2013.

  [6] C. Wan, M. Huang, C. K. Tse, S. C. Wong and X. Ruan, “Nonlinear behavior and instability in three-phase boost rectifier connected to non-ideal power grid with interacting load,” IEEE Transactions on Power Electronics, vol. 28, no. 7, pp. 3255-3265, Jul. 2013.

  [7] M. Huang, S. C. Wong, C. K. Tse and X. Ruan, “Catastrophic bifurcation in three-phase voltage-source converters,” IEEE Transactions on Circuits and Systems I – Regular Papers, vol. 60, no. 4, pp. 1062-1071, Apr. 2013.

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